Laboratoire d’Automatique Appliquée &
Diagnostic Industriel LAADI
 Université de DJELFA                                                                      
ar  en fr 

              DR. OMAR MANSOUR

                         INDUSTRIAL DIAGNOSIS    

                                                                 Email: This email address is being protected from spambots. You need JavaScript enabled to view it.                                                                                                                                                                                                

OMAR MANSOUR

Dr Omar Mansour, was born in Sidi Bel Abbes, Algeria on 1972. He received the Habilitation degree to direct researches on physics in 2013 and D.E.S on Solid Physics in 1994 from the University of Sidi Bel Abbes, Algeria. He received the PhD degree on physics of the material in 2010 and the Magister degree on electronics in 2005 from the same university. Currently, he is the team leader of Signal and Embedded Systems, is interested in the hardware aspects of embedded systems in real time and carries out applied research on various themes, related to the Applied Automatics and real-time industrial diagnosis.

 

PUBLICATIONS

 [1].    H. Zoulikha, Omar Mansour, A.Kadoun, L.Khouchaf, C.Mathieu, Gas effect on the emission and detection of backscattered electrons in an VP-SEM at low energy, Journal of Ultramicroscopy 184 (2018) 17–23.

URL: http://www.sciencedirect.com/science/article/pii/S0304399117303091

[2].    S.Zebbar, A.Kadoun, D.Zebbar, Omar Mansour, Study of Quenching Gases effect in the environmental scanning electron microscope (ESEM), Journal of Chemistry and Material Research  6 (2017), 16-21.

URL: http://www.oricpub.com/Vol.%206%20(1),%202017,%2016-21.pdf

[3].    Omar Mansour, A.Kadoun, L.Khouchaf,  C.Mathieu, Monte Carlo simulation of the electron beam scattering under water vapor environment at low energy. Journal of Vacuum 87 (2013), 11-15.

URL: http://www.sciencedirect.com/science/article/pii/S0042207X12003296

[4].    Omar Mansour, A.Kadoun, K.Aidaoui, L.Khouchaf, C.Mathieu, Monte Carlo simulation of the electron beam scattering under gas mixtures environment in an HPSEM at low energy. Journal of Vacuum 84 (2009), 458-463.

URL: http://www.sciencedirect.com/science/article/pii/S0042207X09004382

INTERNATIONALES CONFERENCES

[1].    Near field study with the photon scanning tunneling microscope: comparison between dielectric and metallic nanostructure. Journée d’Etude sur la PG de Micro-Opto-Electronique JEPGMO, Université d’Oran,24 Avril 2006

[2].    Use of water vapor in the ESEM for biological investigation.Première Journée Internationale sur la Pollution Urbaine et les Energies Propres,  Université Djillali Liabes, 30 avril 2006

[3].    Investigating biological structure with environmental scanning electron microscopy (ESEM). Première école de biophysique, université d’Oran, Esenia ; 07-09 avril 2008

[4].    Monte simulation of the electron beam scattering under water vapor environment at very low energy. North African conference on computational physics and chemistry 2008  Sidi Bel Abbès, 23-25 novembre 2008

[5].    The Monte Carlo simulation: an interesting tool for the understanding of high pressure scanning  electron microscopy. North African conference on computational physics and chemistry 2008  Sidi Bel Abbès, 23-25 novembre 2008

[6].    Electron beam behavior in a gas mixture under low voltage in the environmental SEM. SecondeNorth African conference on computational physics and chemistry. Sidi Bel Abbès, 12–14 Decembre 2010

[7].    Change in the electron beam in a VP-SEM at low voltage; Monte Carlo simulation. The first International Conference on “Research to Application and Markets (RAM 2011), Tunisia, Monastir, 23-25 jun 2011

[8].    Characterization of dielectric materials in HPSEM. North African workshop on Dielectric materials for photovoltaic systems; 26-27 avril 2014; Tlemcen

[9].    Monte Carlo simulation as a predictive tool for material science and characterization. New Prospects and Challenges for Science and Education in the MENA region, Marrakech, 9-11 Mars 2011

[10].    Contribution to the study of backscattered electron in HPSEM by Monte Carlo simulation. International Conference on Applied automation and Industrial diagnostic (ICCAID 2015); 29-30 mars 2015, Djelfa Algeria

[11].    Influence of the chemical nature of the gas and of the material on the emission of backscattered electrons. Premier Congre de Physique et chimie quantique; 31-mars au 02 avril 2015, Tizi Ouzou, Algerie

[12].    Gas mixture in an environmental scanning electron microscope: Usefulness and use in the secondary electrons-signal amplification. Bacons of Hope in the Quest for the Next Einstein in the MENA region (BoHMena’15); 03-06 mars 2015, Fez, Maroc

[13].    Correlation between the interaction volume and EBIC current in a Schottky barrier on silicon. 2nd International Conference on Applied automation and Industrial diagnostic (ICCAID 2017); 16-17 mars 2017, Djelfa Algeria

NATIONALE CONFERENCES

[1].    Study of  interaction electron-gas effects in SEM under H2O, N2 et He pressure, Workshop on Nanosciences and Nanotechnologies, Université d’Oran, 13-14 Décembre 2005

[2].    Simulation de l’intensité diffractée par un réseau de nanostructure diélectrique. Workshop on Nanosciences and Nanotechnologies, Université d’Oran, 13-14 Décembre 2005

[3].    Scattering cross section and skirt measurement. Journée d’Etude sur la PG de Micro-Opto-Electronique JEPGMO, Université d’Oran,24 Avril 2006

[4].    Analysis of Charging Compensation on Oxides and Hydroxides in Oxygen and Water Vapour Environmental Scanning Electron Microscopy. Journées sur la Physique et ses Application, Université Ibn Khaldoun Tiaret, 06-08 mai 2007

[5].    Ecole d’été sur la modélisation et la simulation numérique en physique, Université Mouloud Mameri  de Tizi-Ouzou, 22-28 juin 2007

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